Constant off-time control method for buck converters using coupled inductors

ABSTRACT

A system that includes a regulator unit is disclosed. The regulator unit includes first and second phase units whose outputs are coupled to through first and second coupled inductors, respectively, to a power supply node of a circuit block. The first phase unit may be configured to discharge, for a first period of time, the power supply node through the first inductor in response to determining a sense current is greater than a demand current. The operation of the second phase unit may follow that of the first phase unit after a second period of time has elapsed.

PRIORITY INFORMATION

The present application claims benefit of priority to U.S. ProvisionalApplication No. 62/398,312 titled “A CONSTANT OFF-TIME CONTROL METHODFOR BUCK CONVERTERS USING COUPLED INDUCTORS” and filed on Sep. 22, 2016,which is hereby incorporated by reference in it entirety as though fullyand completely set forth herein.

BACKGROUND Technical Field

Embodiments described herein relate to integrated circuits, and moreparticularly, to techniques for generating regulated power supplyvoltages.

Description of the Related Art

A variety of electronic devices are now in daily use with consumers.Particularly, mobile devices have become ubiquitous. Mobile devices mayinclude cell phones, personal digital assistants (PDAs), smart phonesthat combine phone functionality and other computing functionality suchas various PDA functionality and/or general application support,tablets, laptops, net tops, smart watches, wearable electronics, etc.

Such mobile devices may include multiple integrated circuits, eachperforming different tasks. In some cases, circuits that performdifferent tasks may be integrated into a single integrated forming asystem on a chip (SoC). The different functional units within a SoC mayoperate at different power supply voltage levels. In some designs, powersupply or regulator circuits may be included in, or external to, the SoCto generate different voltage levels for the myriad functional unitsincluded in the SoC.

Regulator circuits may include one or more reactive circuit components.For example, individual regulator sub-assemblies may employ acombination of inductors or capacitors. The reactive circuit componentsmay be fabricated on an integrated circuit with the regulator circuits,or they may be included as discrete components in a semiconductorpackage or circuit board.

SUMMARY OF THE EMBODIMENTS

Various embodiments of a system including an integrated circuit die anddecoupling unit are disclosed. Broadly speaking, a system iscontemplated in which a first inductor is coupled to a power supply nodeof a circuit block, and a second inductor is coupled to the power supplynode and is inductively coupled to the first inductor. A first phaseunit may be configured to generate a demand current using a referencevoltage and a voltage level of the power supply node, and to compare thedemand current to a current being source to the power supply nodethrough the first inductor. The first phase unit may be furtherconfigured to discharge, for a first time period, the power supply nodethrough the first inductor in response to a determination that thecurrent being sourced to the power supply node is greater than thedemand current. Additionally, the first phase unit may charge the powersupply node through the first inductor in response to a determinationthat the first time period has expired. The second phase unit may beconfigured to discharge, for a second time period, the power supply nodethrough the second inductor and charge the power supply node through thesecond inductor in response to a determination that a third time periodhas expired since the first phase unit began to charge the power supplynode through the first inductor.

In one embodiment, the first phase unit may include a first drivercircuit coupled to the first inductor. The first phase unit may befurther configured to determine a first average voltage at a firstoutput terminal of the first driver circuit while charging the powersupply node through the first inductor.

In a further embodiment, the second phase unit may include a seconddriver circuit coupled to the second inductor. The second phase unit maybe further configured to determine a second average voltage at a secondoutput terminal of the second driver circuit while charging of the powersupply node through the second inductor.

BRIEF DESCRIPTION OF THE DRAWINGS

The following detailed description makes reference to the accompanyingdrawings, which are now briefly described.

FIG. 1 illustrates an embodiment of a computing system.

FIG. 2 illustrates an embodiment of a regulator unit.

FIG. 3 illustrates an embodiment of a phase unit of a regulator unit.

FIG. 4 illustrates another embodiment of a phase unit of a regulatorunit.

FIG. 5 depicts an embodiment of a filter circuit.

FIG. 6 depicts examples waveforms associated with operating anembodiment of a regulator unit.

FIG. 7 depicts a flow diagram illustrating an embodiment of a method foroperating a regulator unit.

While the disclosure is susceptible to various modifications andalternative forms, specific embodiments thereof are shown by way ofexample in the drawings and will herein be described in detail. Itshould be understood, however, that the drawings and detaileddescription thereto are not intended to limit the disclosure to theparticular form illustrated, but on the contrary, the intention is tocover all modifications, equivalents and alternatives falling within thespirit and scope of the present disclosure as defined by the appendedclaims. The headings used herein are for organizational purposes onlyand are not meant to be used to limit the scope of the description. Asused throughout this application, the word “may” is used in a permissivesense (i.e., meaning having the potential to), rather than the mandatorysense (i.e., meaning must). Similarly, the words “include,” “including,”and “includes” mean including, but not limited to.

Various units, circuits, or other components may be described as“configured to” perform a task or tasks. In such contexts, “configuredto” is a broad recitation of structure generally meaning “havingcircuitry that” performs the task or tasks during operation. As such,the unit/circuit/component can be configured to perform the task evenwhen the unit/circuit/component is not currently on. In general, thecircuitry that forms the structure corresponding to “configured to” mayinclude hardware circuits. Similarly, various units/circuits/componentsmay be described as performing a task or tasks, for convenience in thedescription. Such descriptions should be interpreted as including thephrase “configured to.” Reciting a unit/circuit/component that isconfigured to perform one or more tasks is expressly intended not toinvoke 35 U.S.C. § 112, paragraph (f) interpretation for thatunit/circuit/component. More generally, the recitation of any element isexpressly intended not to invoke 35 U.S.C. § 112, paragraph (f)interpretation for that element unless the language “means for” or “stepfor” is specifically recited.

DETAILED DESCRIPTION OF EMBODIMENTS

Computing systems may include multiple functional units or circuitblocks. These circuit blocks may be mounted together in a commonintegrated circuit package, or circuit board. Some computing systems mayinclude multiple circuit blocks on a single integrated circuit, commonlyreferred to as a “System-on-a-chip” or “SoC.” Each circuit block withina computing system, may operate at a different voltage levels, which maybe different than a voltage level of a master power supply of thecomputing system. In order to generate the desired voltage levels, oneor more regulator units may be employed.

In some computing systems, DC-DC switching regulators are used togenerate the desired voltage levels. Switching regulators rapidly switcha series of devices, such as, e.g., transistors, on and off in order totransfer charge to or from a load through an inductor (commonly referredto as a “charge cycle” and “discharge cycle,” respectively). The loadmay include one or more of the aforementioned circuit blocks. Byadjusting the duration of the time individual devices are switched onand off, the voltage level at the load may be kept within apredetermined range of a desired value.

To control how the devices are switched on and off in order to maintainthe desired value voltage level at the load, regulators employ varyingcontrol methods. For example, in current mode control methods, slopecompensation may be required to maintain stability of the current loop.The circuits associated with performing slope compensation add area,power consumption, and complexity to a regulator.

In cases were multiple coupled inductors are employed, slopecompensation circuits may become even more complicated. The embodimentsillustrated in the drawings and described below may provide techniquesfor using multiple coupled inductors with a constant off-time controlmechanism in a regulator unit while limiting the impact on designcomplexity, area, and power consumption.

A block diagram of a computing system including multiple devices orfunctional units is illustrated in FIG. 1. In the illustratedembodiment, computing system 100 includes regulator unit 101, andCircuit Blocks 102 a and 102b. Regulator Unit 101 is coupled to powersupply 105, and regulated power supply 103. Circuit Blocks 102 a and 102b are also coupled to regulated power supply 103. Additionally, CircuitBlock 102 a is coupled to Circuit Block 102 b via communication bus 104.

As described below in more detail, Regulator Unit 101 may, in variousembodiments, be configured to generate regulated power supply 103 usingpower supply 105. A voltage level of regulated power supply 103 may beless than, equal to, or greater than a voltage level of power supply 105dependent upon the needs of Circuit Blocks 102 a and 102 b. Althoughonly a single regulated power supply is depicted in the embodimentillustrated in FIG. 1, in other embodiments, multiple regulated powersupplies may be employed. In such cases, different devices may becoupled different regulated power supplies. Alternatively, a singledevice may be coupled to multiple regulated power supplies.

In the illustrated embodiment, either of Circuit Blocks 102 a or 102 bmay include a processor, processor complex, or a memory. In someembodiments, Circuit Blocks 102 a and 102 b may include Input/Output(I/O) circuits or analog/mixed-signal circuits. In various embodiments,computing system 100 may be configured for use in a desktop computer,server, or in a mobile or wearable computing application. It is notedthat although FIG. 1 illustrates only two circuit blocks, in otherembodiments, any suitable number of circuit blocks may be employed.Additional communication busses may also be employed to connect thevarious devices.

As used and described herein, a processor or processor complex havingone or more processors or processor cores may, in various embodiments,be representative of a general-purpose processor that performscomputational operations. For example, a processor may be a centralprocessing unit (CPU) such as a microprocessor, a microcontroller, anapplication-specific integrated circuit (ASIC), or a field-programmablegate array (FPGA).

In the present disclosure, a memory may describe any suitable type ofmemory such as a Dynamic Random Access Memory (DRAM), a Static RandomAccess Memory (SRAM), a Read-only Memory (ROM), Electrically ErasableProgrammable Read-only Memory (EEPROM), or a non-volatile memory, forexample.

Analog/mixed-signal circuits may include a variety of circuitsincluding, for example, a crystal oscillator, a phase-locked loop (PLL),an analog-to-digital converter (ADC), and a digital-to-analog converter(DAC) (all not shown). In other embodiments, analog/mixed-signalcircuits included in one of devices 102 a or 102 b may include, radiofrequency (RF) circuits that may be configured for operation withwireless networks.

As used herein, I/O circuits may be configured to coordinate datatransfer between computing system 100 and one or more peripheraldevices. Such peripheral devices may include, without limitation,storage devices (e.g., magnetic or optical media-based storage devicesincluding hard drives, tape drives, CD drives, DVD drives, etc.), audioprocessing subsystems, or any other suitable type of peripheral devices.In some embodiments, I/O circuits may be configured to implement aversion of Universal Serial Bus (USB) protocol, IEEE 1394 (Firewire®)protocol, or an Ethernet (IEEE 802.3) networking standard such asGigabit Ethernet or 10-Gigabit Ethernet.

In some embodiments, each of the aforementioned circuit blocks mayinclude multiple circuits, each of which may include multiple devices,such as, e.g., metal-oxide semiconductor field-effect transistors(MOSFETs) connected via multiple wires fabricated on multiple conductivelayers. The conductive layers may be interspersed with insulatinglayers, such as, silicon dioxide, for example. Each circuit may alsocontain wiring, fabricated on the conductive layers, designated for apower supply net (or node) or a ground supply net (or node).

Each of Regulator Unit 101 and Circuit Blocks 102 a and 102 b may, invarious embodiments, be fabricated on a silicon wafer (or simply“wafer”) along with numerous identical copies of Regulator Unit 101 andCircuit Blocks 102 a and 102 b, each of which may be referred to as a“chip” or “die.” During manufacture, various manufacturing steps may beperformed on each chip in parallel. Once the manufacturing process hasbeen completed, the individual chips may be removed from the wafer bycutting or slicing through unused areas between each chip.

In other embodiments, Regulator Unit 101 may be fabricated on a separatechip than Circuit Blocks 102 a and 102 b. In such cases, Regulator Unit101 and Circuit Blocks 102 a and 102 b may be coupled together inside asemiconductor package. Alternatively, Regulator Unit 101 and CircuitBlocks 102 a and 102 b may be mounted on a common circuit board or othersuitable substrate. In such cases, wiring for regulated power supply 103and communication bus 104 may include multiple metal layers fabricatedinto the package or circuit board.

Turning now to FIG. 2, an embodiment of a regulator unit is illustrated.Regulator unit 200 may, in various embodiments, correspond to RegulatorUnit 101 as depicted in FIG. 1. In the illustrated embodiment, regulatorunit 200 includes phase units 201 a-b, Reference Generator 205, filters210 a-b, and inductors 211a-b.

Each of phase units 201 a and 201 b may be configured to charge ordischarge Regulated Supply 204, by sourcing to or sinking current fromRegulated Supply 204, through inductors 211 a and 211 b, respectively.As described below in more detail in regard to FIG. 3 and FIG. 4, eachphase unit of phase units 201a-d may operate differently.

In the illustrated embodiment, Phase-0 Unit 201 a may initiate adischarge cycle (also referred to as an “off cycle”) in response to adetermination that the current being sourced to Regulated Supply 204 isgreater than current being demanded by a load circuit coupled toRegulated Supply 204. Phase-0 Unit 201 a may then sink current, i.e.,discharge Regulated Supply 204, through inductor 211 a for apredetermined period of time. This period of time is commonly referredto as a “constant off time.” Since Phase-0 Unit 201 a begins todischarge Regulated Supply 204 based on current measurements, it may bereferred to as a “Master Phase Unit.”

Phase-1 Unit 201 b, however, begins a discharge of Regulated Supply 204,by sinking current through inductor 211 b, in response to the dischargeby Phase-0 Unit 201 a. The initiation of charging and discharging byPhase-1 Unit 201 b tracks that of Phase-0 Unit 201 a after apredetermined delay. Since the operation of Phase-1 Unit 201 b tracksthat of Phase-0 Unit 201 a, Phase-1 Unit 201 b may referred to as a“Slave Phase Unit.”

As described below in more detail in regard to FIG. 3 and FIG. 4, eachof Phase-0 Unit 201 a and Phase-0 Unit 201 b includes a driver circuitconfigured to source current to or sink current from Regulated Supply204 through a respective one of inductors 211 a and 211 b. Due to on-dievariations, or other manufacturing effects, the DC currents sourced bythe two different phase units may be different.

To compensate for an offset between the two DC currents, the delay bywhich Phase-1 Unit 201 b tracks Phase-0 Unit 201 a may be adjusted. Theadjustment is made based on a comparison of average voltages at theoutputs of the two phase units. To generate the average voltages,Filters 210 a and 210 b are coupled to the output terminals of thedriver circuits of Phase-0 Unit 201 a and Phase-1 Unit 201 b,respectively. As described below in regard to FIG. 5, each of Filters210 a and 210 b is configured to perform a low-pass filter function inorder to generate Filter signals 208 and 209, respectively. Filtersignals 208 and 209 are coupled to Phase-1 Unit 201 b to allow for theadjust the delay between the two phase units.

Inductor 211 a is coupled between an output terminal of Phase-0 Unit 201a and Regulated Supply 204. In a similar fashion, inductor 211 b iscoupled between an output terminal of Phase-1 Unit 201 b and RegulatedSupply 204. Inductors 211 a and 211 b are also inductively coupled toeach other. The amount of coupling is specified by Coupling coefficient212. In various embodiments, the amount of coupled between inductors 211a and 211 b may be determined based on the physical proximity betweenthe two inductors. In some cases, additional materials may be depositedbetween the two inductors to enhance inductive coupling between the twoinductors.

Inductors 211 a and 211 b may be included in an integrated circuit withthe remaining circuits blocks of regulator unit 200. In otherembodiments, inductors 211 a and 211 b may be fabricated on a separateintegrated circuit die, which may then be coupled to an integratedcircuit die including regulator unit 200 during a package assemblyprocess.

Reference Generator 205 may be configured to generate a predeterminedvoltage level (also referred to herein as a “reference voltage level”)for reference voltage 207. The reference voltage level may, in variousembodiments, be adjustable upon completion of a manufacturing process.Alternatively, or additionally, the reference voltage level may beadjustable during operation by the programming of one or more registers(not shown) in response to changes in operating mode of a computingsystem, or in response to the execution of one or more softwareinstructions by a processor included in the computing system.

In various embodiments, Reference Generator 205 may include a band gapreference circuit, or other suitable reference circuit, for generating atemperature and/or power supply independent reference voltage. ReferenceGenerator 205 may also include one or more current mirrors, amplifiers,or other suitable analog circuitry necessary to adjust an initiallygenerated voltage level to a desired level.

It is noted that the embodiment depicted in FIG. 2 is merely an example.In other embodiments, different functional units, and differentarrangements of functional units are possible and contemplated.

An embodiment of Phase-0 Unit 201 a is illustrated in FIG. 3. In theillustrated embodiment, Phase-0 Unit 201 a includes transconductanceamplifier 301, comparator 320, Pulse Generator 316, Delay Circuit 302,latch 303, driver circuit 313, pre-driver 318, and Current Sensor 306.

Transconductance amplifier 301 may be configured to convert a differencebetween reference voltage 207 and Regulated Supply 204 to i_(demand)current flowing in node 314. In general, a value of i_(demand) currentmay be proportional to a difference between reference voltage 207 andRegulated Supply 204. In some embodiments, transconductance amplifier301 is operated without negative feedback, i.e., is may be operated“open loop.”

Comparator 320 may be configured to generate an output signal on node309 based upon a difference between i_(demand) current and i_(sense)current flowing in node 315. In various embodiments, a voltage level ofthe signal on node 309 may be proportional to the difference between thevalues of the two aforementioned currents. In other embodiments,comparator 320 may generate a digital signal whose logic low levelcorresponds to a ground potential and whose high logic high levelcorresponds to a voltage level sufficient to enable a n-channelmetal-oxide field-effect transistor (MOSFET).

In some embodiments, Pulse generator 316 may be configured to generate apulse on reset 317 based on the voltage level of the signal on node 309.Pulse generator may, in various embodiments, includes delay circuits,and logic gates arranged to generate pulses from either one or the otherof rising or falling edges of the signal on node 309.

Latch circuit 303 may, in various embodiments, correspond to a specificembodiment of a reset-set (RS) latch, and may be designed in accordancewith one of varying design styles, including, but not limited to, bothstatic and dynamic implementations. In the illustrated embodiment, thecomplementary output of latch 303, denoted as Q-bar, may be set to a lowlogic value in response to the assertion of a particular pulse occurringon set 307. Latch 303 may be reset, i.e., output Q-bar set to a highlogic level, in response to the assertion of reset 317.

Delay Circuit 302 is configured to delay reset 317 in order to generateset 307. In various embodiments, Delay Circuit 302 may include multipledelay lines through which reset 317 is routed. The selection of whichdelay lines are employed may be configurable during operation or duringan initialization routine for Phase-0 Unit 201 a. In other embodiments,Delay Circuit 302 may include an analog delay circuit whose delay valueis determined by a voltage level of a control signal (not shown).

In some embodiments, pre-driver circuit 318 may include circuitryconfigured to generate control signals 319 a and 319 b, coupled totransistors 304 and 305, respectively. In response to changes in thelogic level on node 312, pre-driver 318 may independently assert andde-assert control signals 319 a and 319 b. In some embodiments, anasserted one of control signals 319 a and 318 b may be de-asserted priorto assertion of the de-asserted control signal. By independentlyasserting and de-asserting control signals 319 a and 319 b, current flowfrom the power supply to ground through the driver (commonly referred toas “shoot through” current) may be reduced in various embodiments.

Driver circuit 313 may, in various embodiments, includes transistor 304and transistor 305. In some embodiments, transistor 304 may correspondto a p-channel MOSFET, and may be configured to source current to Output308, thereby charging Regulated Supply 204, in response to a low logiclevel on control signal 319 a. Transistor 305 may, in variousembodiments, correspond to an n-channel MOSFET, and may be configured tosink current from Output 308, thereby discharging Regulated Supply 204,in response to a high logic level on control signal 319 b. It is notedthat although driver circuit 313 is depicted as using MOSFETs, in otherembodiments, any suitable transconductance device may be employed.

Current Sensor 306 is configured to determine a current flowing fromtransistor 304 into Output 308. The determined current is then sent tothe input of Comparator 320 via node 315 as i_(sense). In variousembodiments, Current Sensor 306 may include a resistor in series withtransistor 304 and Output 308. A voltage drop across the resistor may beused to generate i_(sense). Current Sensor 306 may also include one ormore active devices, such as, e.g., MOSFETs, to form current mirrors, orany other suitable circuits than may be employed to generate i_(sense).

It is noted that the embodiment of the capacitor model illustrated inFIG. 3 is merely an example. In other embodiments, different circuitelements and different configurations of circuit elements may beemployed.

Turning to FIG. 4, an embodiment of Phase-1 Unit 201 b is depicted. Inthe illustrated embodiments, Phase-1 Unit 201 b includes Comparator 407,Counter 409, Delay Circuit 403, Delay Circuit 404, latch 411, pre-driver417, and driver 417.

Comparator 407 may be configured to compare Filter signals 208 and 209.As described below in regard to FIG. 5, Filter signals 208 and 209 aregenerated by filter circuits, which average the variations in thevoltages output by Phase-0 Unit 201 a and Phase-0 Unit 201 b. Dependingon which of the two filter signals is greater, Comparator 407 may assertor de-assert signal 408. In various embodiments, Comparator 407 mayinclude a differential amplifier, or any other circuit suitable forcomparing voltage levels.

Using the logical state of signal 408, Counter 409 may increment ordecrement a count value. Counter 409 may be incremented or decrementedwhen the signal on node 414 is asserted. In various embodiments, Counter409 may include any suitable number of bits and may be reset duringinitialization of the Phase-1 Unit 201 b. Although not shown, in someembodiments, a particular value may be loaded into Counter 409 followinga reset.

The output of Counter 409, signal 410, is used to control the value ofDelay Circuit 403. Although depicted in FIG. 4 as a single signal, invarious embodiments, signal 410 may include any suitable number of databits. Delay Circuit 403 may include multiple delay lines, or othersuitable circuits that generate delay. A selection of which of themultiple delay lines reset 317 is directed may be dependent upon thevalue signal 410. In other embodiments, the value of signal 410 may beused as input to a digital-to-analog converter (DAC) that generates avoltage level used to control an analog delay line through which reset317 is routed. By adjusting the delay through Delay Circuit 403,compensation for any difference between the DC currents on Phase-0 Unit201 a and Phase-1 Unit 201 b may be realized.

In a similar fashion to Delay Circuit 403, Delay Circuit 404 maygenerate set 413, which is a delayed version of set 307 from Phase-0Unit 201 a. Delay Circuit 403 may include multiple delay lines, or ananalog delay line. In various embodiments, an amount of delay generatedby Delay Circuit 403 may be adjustable during operation.

Latch 411 is a particular embodiment of an reset-set (RS) latch that isset in response to an assertion of set 413, and reset in response to anassertion of reset 412. When latch 411 is set, the complement output oflatch 411, i.e., Q-bar, is at a high logic level, and when latch 411 isreset, Q-bar is at a low logic level. Latch 411 may, in variousembodiments, include any suitable combination of logic gates and/ortransistors configured to implement the desired function.

Pre-driver circuit 415 may include circuitry configured to generatecontrol signals 416 a and 416 b, coupled to transistors 418 a and 418 b,respectively. In response to changes in the logic level on node 414,pre-driver 415 may independently assert and de-assert control signals416 a and 416 b. In some embodiments, an asserted one of control signals416 a and 416 b may be de-asserted prior to assertion of the de-assertedcontrol signal. By independently asserting and de-asserting controlsignals 416 a and 416 b, shoot through current from the power supply toground through driver 417 may be reduced.

Driver circuit 417 includes transistor 418 a and transistor 418 b. Insome embodiments, transistor 418 a may correspond to a p-channel MOSFET,and may be configured to source current to Output 419 in response to alow logic level on control signal 416 a. Transistor 418 b may, invarious embodiments, correspond to an n-channel MOSFET, and may beconfigured to sink current from Output 419 in response to a high logiclevel on control signal 416 b. It is noted that although driver circuit417 is depicted as using MOSFETs, in other embodiments, any suitabletransconductance device may be employed.

It is noted that the embodiment depicted in FIG. 4 is merely an example.In other embodiments, different circuits and different arrangements ofcircuits may be included in Phase-1 Unit 201 b.

As described above, the average currents of the two phase units may beemployed to compensate for any offset in the DC currents of the twophase units. To generate the average currents, a filter circuit may beused. An embodiment of such a filter circuit is illustrated in FIG. 5.In various embodiments, filter 500 may correspond to either of Filters210 a or 210 b as depicted in FIG. 2. In the illustrated embodiment,filter 500 includes resistor 503 and capacitor 504.

Resister 503 is coupled to Input signal 501 and Filtered signal 502. Invarious embodiments, Input Signal may correspond to the output signal ofeither Phase Unit 201 a or Phase Unit 201 b, and Filtered signal 502 maycorrespond to either of filter signals 208 or 209. Capacitor 504 iscoupled to Filter signal 502 and a ground node.

Values of resistor 503 and capacitor 504 may be selected to provide adesired impedance between Input Signal 501 and the ground node at aparticular frequency. The desired impedance may result in high frequencycomponents included in Input signal 501 to be shorted to the groundnode, thereby providing a low frequency components included in Inputsignal 501 to appear on Filtered signal 502. As described above inregard to FIG. 2 and FIG. 4, Filtered signal 502 may be used todetermine any current mismatch between Phase Units 201 a and 201 b.

It is noted that the embodiment depicted in FIG. 5 is merely an example.Although a single resistor and capacitor as show in the embodimentdepicted in FIG. 5, in other embodiments, different numbers anddifferent arrangements of the resistors and capacitors may be employed.Additionally, or alternatively, other reactive circuit elements, suchas, e.g., inductors, may be used to implement the desired filter effect.

As an aid in the explanation of the operation of Phase-0 Unit 201 a andPhase-1 Unit 201 b, example waveforms are depicted in FIG. 6. At timet_(o), reset 317 is asserted. As described above in regard to FIG. 3,the assertion of reset 317 is the result of a determination thati_(sense) is greater than i_(demand). Phase-0 unit 201 a will begin adischarge of Regulated Supply 204 in response to the assertion of reset317.

The discharge Regulated Supply 204 by Phase-0 Unit 201 a continues untiltime t₁, at which point set 307 is asserted, resulting in Phase-0 Unit201 a to stop discharging and begin charging Regulated Supply 204. Thedelay from from t₀ to t₁ is determined by the value of Delay Circuit302. In various embodiments, Delay Circuit 302 may be adjustable orprogrammable depending on one or more system operating parameters.

At time t₂, reset 412 is asserted in response to the assertion of reset317. The delay from time t₀ to t₂ is determined by the value of DelayCircuit 403. During operation, the value of Delay Circuit 403 may beadjusted. As described above in regard to FIG. 4, a new value of DelayCircuit 403 may be based upon a comparison of the Filter signal 208 andFilter signal 209. Such an adjustment may compensate for an offset inthe DC currents between Phase-0 Unit 201 a and Phase-1 Unit 201 b.

As with the assertion of reset 317 triggering the assertion of reset 412at a later time, the assertion of set 307 triggers the assertion of set413 at time t3. The difference between time t₁ and t₃ is determined bythe value of Delay Circuit 404. Between time t₂ and t₃, Phase-1 Unit 201b is discharging Regulated Supply 204 through inductor 211 b. Once set412 is asserted, Phase-1 Unit 201 b halts discharging and begins tocharge Regulated Supply 204 by sourcing a current to the supply throughinductor 211 b.

It is noted that the waveforms depicted in FIG. 6 are merely examples.In other embodiments, different relative timing between the varioussignals may be possible.

Turning to FIG. 7, a flow diagram depicting an embodiment of a methodfor operating a regulator unit is illustrated. Referring collectively tothe embodiments of FIG. 2, FIG. 3, and FIG. 4, and the flow diagram ofFIG. 7, the method begins in block 701. For the purposes of explanation,it is assumed that Phase-0 Unit 201 a is charging Regulated Supply 204as the method begins.

Transconductance device 301 may generate i_(demand) (block 702). Asdescribed above, to generate i_(demand), transconductance device 301 maydetermine a different in the voltage levels of Reference 201 andRegulated Supply 204. The difference in the voltage levels may then beconverted into a current.

I_(demand) may then be compared to i_(sense) (block 703). I_(sense) maybe determined using Current sensor 306. In various embodiments, Currentsensor 306 may include a small value resistor, whose voltage drop ismeasured in order to determined isense 315. Current sensor 306 may, inother embodiments, include any suitable circuit capable of measuring acurrent moving in Output voltage 308.

Based on a result of the comparison between i_(demand) and i_(sense),Phase-0 Unit 201 a may initiate a discharge cycle (block 704). Invarious embodiments, when i_(sense) is greater than i_(demand), PulseGenerator 316 may create a pulse on reset 317, which, in turn, resetslatch 303. Once latch 303 is reset, signal 312 may transition to a highlogic level, activating device 305 discharging Output 308. The reductionin the voltage level of Output 308 resulting from the activation ofdevice 305 causes a discharge of Regulated Supply 204 through inductor211 a.

After a first time period has elapsed, the discharge cycle beingperformed by Phase-0 Unit 201 a may be halted (block 705). The pulse onreset 317 may be delayed by Delay circuit 302 to generate a pulse on set307. An amount of delay provided by Delay circuit 302 may be selectedsuch that once pulse on reset 317 has completed, the pulse on set 307begins. In response to the pulse on set 307, latch 303 may be set,resulting in a low logic level on node 312. Pre-driver circuit 318 maytransition nodes 319 a-b to low logic levels, deactivating device 305and activating device 304. Current may then flow from the power supplythrough device 304 to output 308, through inductor 211 a, resuming thecharging of Regulated Supply 204. Once charging of Regulated Supply 204has resumed, the method may conclude in block 708.

In parallel to the operations performed in association with block 705,Phase-1 Unit 201 b may initiate a discharge of Regulated Supply 204through inductor 211 b after a second time period has elapsed since theinitiation of the phase-0 discharge (block 706). The pulse on reset 317may be delayed by Delay Circuit 403 to generate a delayed pulse on reset412. As described above, the second time period is determined by theamount of delay provided by Delay Circuit 403, which may be adjustedbased on a comparison between filter signal 208 and filter signal 209.In response to the delayed pulse on reset 412, latch 411 resets causingnode 414 to be set to a high logic level. In response to the transitionon node 414, Pre-driver 415 may transition signals 416 a and 416 b tohigh logic levels deactivating device 418 a and activating device 418 b.The activation of device 418b sinks current from Output 419 to ground,which, in turn, discharges Regulated Supply 204 through inductor 211 b.

After a third time period has elapsed, Phase-1 Unit 201 b may halt thedischarge of Regulated Supply 204 through inductor 211 b and begin tocharge Regulated Supply 204 through inductor 211 b (block 707). Set 307may be delayed by Delay Circuit 404 to generate set 413. When set 413 isasserted, latch 411 may be set, resulting in a transition on node 414 toa low logic level. In response to the transition of node 414 to a lowlogic level, pre-driver 415 may transition signals 416 a and 416 b tolow logic levels, deactivating device 418 b and activating device 418a.The activation of device 418 a sources a current to Output 419, which,in turn, charges Regulated Supply 204 through inductor 211 b. With thecharging of Regulated Supply 204, the method concludes in block 708.

It is noted that the embodiment of the method depicted in the flowdiagram of FIG. 7 is merely an example. In other embodiments, differentoperations, and different orders or operations are possible andcontemplated.

Although specific embodiments have been described above, theseembodiments are not intended to limit the scope of the presentdisclosure, even where only a single embodiment is described withrespect to a particular feature. Examples of features provided in thedisclosure are intended to be illustrative rather than restrictiveunless stated otherwise. The above description is intended to cover suchalternatives, modifications, and equivalents as would be apparent to aperson skilled in the art having the benefit of this disclosure.

The scope of the present disclosure includes any feature or combinationof features disclosed herein (either explicitly or implicitly), or anygeneralization thereof, whether or not it mitigates any or all of theproblems addressed herein. Accordingly, new claims may be formulatedduring prosecution of this application (or an application claimingpriority thereto) to any such combination of features. In particular,with reference to the appended claims, features from dependent claimsmay be combined with those of the independent claims and features fromrespective independent claims may be combined in any appropriate mannerand not merely in the specific combinations enumerated in the appendedclaims.

1-20. (canceled)
 21. An apparatus, comprising: a driver circuitconfigured to charge, based on a set signal, an output node coupled to asupply signal via a particular inductor of a plurality of inductors; acomparator circuit configured to perform a comparison of a filteredvoltage level of the output node and a filtered voltage level of anoutput of a different driver circuit; a delay circuit configured todelay a reset signal based on results of the comparison to generate adelayed reset signal; and wherein the driver circuit is furtherconfigured to discharge the output node using the delayed reset signal.22. The apparatus of claim 21, further comprising a counter circuitconfigured to increment based on results of the comparison.
 23. Theapparatus of claim 22, wherein the delay circuit is further configuredto adjust an amount delay between the reset signal and the delayed resetsignal based on a value of the counter circuit.
 24. The apparatus ofclaim 21, further comprising a different delay circuit configured todelay the set signal to generate a delayed set signal.
 25. The apparatusof claim 24, further comprising a latch circuit configured to generate,based on values of the delayed reset signal and the delayed set signal,a logic level on a control node.
 26. The apparatus of claim 25, furthercomprising a pre-driver circuit configured to generate a plurality ofcontrol signals coupled to the driver circuit, wherein respective valuesof the plurality of control signals are based on the logic level on thecontrol node.
 27. A method, comprising: generating a regulated voltagelevel on a supply signal using two phase units coupled to the supplysignal via respective inductors of a pair of mutually coupled inductors;adjusting respective output voltage levels of two phase units based onan offset between respective output currents of the two phase units;comparing adjusted respective output voltage levels of the two phaseunits; and determining a time to initiate a discharge of the supplysignal by at least one of the phase unit based on results of comparingthe adjusted respective output voltage levels of the two phase units.28. The method of claim 27, wherein adjusting the respective outputvoltage levels includes filtering each of the respective output voltagelevels of the two phase units.
 29. The method of claim 28, whereinfiltering each of the respective output voltage levels includescoupling.
 30. The method of claim 27, wherein determining the time toinitiate the discharge of the supply signal includes delaying a resetsignal to generate a delayed reset signal.
 31. The method of claim 30,further comprising adjusting an amount of delay between the reset signaland the delayed reset signal based on results of comparing the adjustedrespective output voltage levels of the two phase units.
 32. The methodof claim 30, further comprising resetting a latch circuit using thedelayed reset signal.
 33. The method of claim 32, further comprisingdischarging the supply signal, by at least one of phase unit of the twophase units, based on output of the latch circuit.
 34. An apparatus,comprising: a reference voltage generator circuit configured to generatea reference voltage level on a reference signal; and a plurality ofphase units coupled to a supply signal via respective inductors of aplurality of mutually coupled inductors; a plurality of filter circuits,wherein each filter circuit is configured to generate a respectivefiltered output signal of a plurality of filtered output signals,wherein a particular filtered output signal is based on an output signalof a corresponding phase unit of the plurality of phase units; andwherein a first phase unit of the plurality of phase units is configuredto determine a time to sink a current from the supply signal via acorresponding inductor of the plurality of mutually coupled inductorsbased on at least one filtered output signal of the plurality offiltered output signals.
 35. The apparatus of claim 34, wherein aparticular filter circuit of the plurality of filter circuits includesat least a resistor and a capacitor coupled in series.
 36. The apparatusof claim 34, wherein to determine the time to sink the current, thefirst phase unit of the plurality of phase units is further configuredto generate a delayed reset signal using a reset signal.
 37. Theapparatus of claim 36, wherein the first phase unit is furtherconfigured to perform a comparison of a first filtered output signal ofthe plurality of filtered output signals and a second filtered outputsignal of the plurality of filtered output signals.
 38. The apparatus ofclaim 37, wherein the first phase unit is further configured to adjustan amount of delay between the reset signal and the delayed reset signalbased on a result of the comparison.
 39. The apparatus of claim 34,wherein the first phase unit is further configured to source, inresponse to an assertion of a set signal, another current to the supplysignal.
 40. The apparatus of claim 34, wherein a second phase unit ofthe plurality of phase units is configured to source, based on acomparison of a voltage level of the supply signal and the referencevoltage level, a different current to the supply signal.